Many industries need to use the latest technology but can’t afford down-time due to electronic device failures. With today’s IC technologies starting from a mainstream node, and moving to 28nm or a future 14nm, electronic device failures are going to increase (see underlying issues). As with any advanced technology, users should be able to qualify what they are buying (i.e. lot characteristics), and then diagnostic device performance over time to avoid failures. Our Silicon Rating technology is the most cost-effective diagnostic tool to overcome this issue.
NanoXplore Silicon Rating technology is an advanced diagnostic tool which easily and efficiently investigates the performance of a logic electronic device at any time, and highlights its potential weaknesses or aging effects.
For many industries reliability is critical and can’t afford a break in the continuity of their business operations. The next step on this path is to monitor electronic logic device reliability to undertake proactive maintenance.